ZEISS celebrates the 50th anniversary of commercial scanning electron microscopy (SEM). In 1965, the first commercial SEM called Stereoscan was built by Cambridge Instrument Company, a UK based ...
Image Credit: Carl Zeiss Microscopy GmbH Based on ZEN Intellesis segmentation results, the size of the scratch area was measured over time using the ZEN Image Analysis module. Image Credit: Carl Zeiss ...
Image Credit: Carl Zeiss Raw Materials ISO 25178 surface roughness evaluation of a Ti-6Al-4V test sample. Results are very similar between XRM and ZEISS Smartproof 5 confocal microscope. Image Credit: ...
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