Boundary Scan technique is most often thought of as a board-level test method, but certain techniques makes system level test with JTAG quite effective. Many types of faults can arise when systems are ...

Full scan methods test all the registers on the chip. Partial scan tests some of them, and boundary scan tests only the input/output cells. JTAG is the IEEE standard for boundary scan. See also ...

as well as wafer and production test considerations. The Serdes is compliant to IEEE 802.3ap. The DFT features include IEEE 1149.6 AC boundary scan, PRBS generators and checkers. Methods for observing ...